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SUBJECT CATEGORY: University of Maryland, et al.
DOCUMENT SUMMARY:
®MDBU¯*ERR01*®MDNM¯Notice of Consolidated Decision on
Applications for DutyFree Entry of Scientific Instruments
This is a decision pursuant to Section 6(c) of the Educational,
Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89
651, as amended by Pub. .10636; 80 Stat. 897; 15 CFR part 301).
Related records can be viewed between 8:30 A.M. and 5:00 P.M. in Room
2104, U.S. Department of Commerce, 14th and Constitution Ave, NW, Washington, D.C.
Comments: None received. Decision: Approved. We know of no instruments
of equivalent scientific value to the foreign instruments described
below, for such purposes as each is intended to be used, that was being
manufactured in the United States at the time of its order.
Docket Number: 08032. Applicant: University of Maryland, Institute for
Research in Electronics and Applied Physics, College Park, MD 20742.
Instrument: Atomic Layer Deposition System. Manufacturer: Beneq Oy,
Finland. Intended Use: See notice at 73 FR 45209, August 4, 2008.
Reasons: This instrument is able to accommodate a variety of substrates
of dissimilar sizes and shapes, including medical implants and flexible
integrated circuits. The instrument also is able to accommodate 3D
samples and has a minimum of six sources per reactor. These features are required for the research.
Docket Number: 08036. Applicant: University of Maryland, College Park,
MD 20742. Instrument: Low Temperature Near Field Confocal Optical
Microscope. Manufacturer: Nanonics Imaging Ltd, Israel. Intended Use:
See notice at 73 FR 45209, August 4, 2008. Reasons: The instrument has
the following features which are essential in performing the research:
simultaneous NSOM/AFM/Confocal imaging, normal force sensing open
system architecture (transmission, reflection and collection modes),
temperature continuously adjustable from 8K to 300K, 5x10[hzbar][bds8]
Torr high vacuum capability, large scanning range (50[micro]m in the Z
direction), fine NSOM spatial resolution (~50nm), multiprobe
capability for independent pump probe measurement control, fast temporal resolution (~300fs).
Docket Number: 08038. Applicant: Washington State University, Pullman,
Washington 991647040. Instrument: Piezoelectric Microarray Spotter.
Manufacturer: Scienion AG, Germany. Intended Use: See notice at 73 FR
45209, August 4, 2008. Reasons: The instrument has a unique feature
which is a noncontact spotter to avoid interference from dust and
sensitivity to shifts in relative humidity. Another essential feature
is that the instrument is able to be used as a liquid handling robot.
Docket Number: 08039. Applicant: University of MichiganDearborn,
Dearborn, MI 48128. Instrument: XRay Computer Tomography System.
Manufacturer: Phoenix XRay Inc., Germany. Intended Use: See notice at
73 FR 45209, August 4, 2008. Reasons: The instrument has an Xray tube
power high enough to penetrate metal alloy specimens which is required
for the research. It also has a relatively high resolution which is also essential to the research.
Dated: August 13, 2008.
Faye Robinson,
Director, Statutory Import Programs Staff, Import Administration. [FR Doc. E819172 Filed 81808; 8:45 am]
BILLING CODE 3510DSS
SUMMARY: University of Maryland, et al.,
DOCUMENT BODY 2:
®MDBU¯*ERR01*®MDNM¯Notice of Consolidated Decision on
Applications for DutyFree Entry of Scientific Instruments
This is a decision pursuant to Section 6(c) of the Educational,
Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89
651, as amended by Pub. .10636; 80 Stat. 897; 15 CFR part 301).
Related records can be viewed between 8:30 A.M. and 5:00 P.M. in Room
2104, U.S. Department of Commerce, 14th and Constitution Ave, NW, Washington, D.C.
Comments: None received. Decision: Approved. We know of no instruments
of equivalent scientific value to the foreign instruments described
below, for such purposes as each is intended to be used, that was being
manufactured in the United States at the time of its order.
Docket Number: 08032. Applicant: University of Maryland, Institute for
Research in Electronics and Applied Physics, College Park, MD 20742.
Instrument: Atomic Layer Deposition System. Manufacturer: Beneq Oy,
Finland. Intended Use: See notice at 73 FR 45209, August 4, 2008.
Reasons: This instrument is able to accommodate a variety of substrates
of dissimilar sizes and shapes, including medical implants and flexible
integrated circuits. The instrument also is able to accommodate 3D
samples and has a minimum of six sources per reactor. These features are required for the research.
Docket Number: 08036. Applicant: University of Maryland, College Park,
MD 20742. Instrument: Low Temperature Near Field Confocal Optical
Microscope. Manufacturer: Nanonics Imaging Ltd, Israel. Intended Use:
See notice at 73 FR 45209, August 4, 2008. Reasons: The instrument has
the following features which are essential in performing the research:
simultaneous NSOM/AFM/Confocal imaging, normal force sensing open
system architecture (transmission, reflection and collection modes),
temperature continuously adjustable from 8K to 300K, 5x10[hzbar][bds8]
Torr high vacuum capability, large scanning range (50[micro]m in the Z
direction), fine NSOM spatial resolution (~50nm), multiprobe
capability for independent pump probe measurement control, fast temporal resolution (~300fs).
Docket Number: 08038. Applicant: Washington State University, Pullman,
Washington 991647040. Instrument: Piezoelectric Microarray Spotter.
Manufacturer: Scienion AG, Germany. Intended Use: See notice at 73 FR
45209, August 4, 2008. Reasons: The instrument has a unique feature
which is a noncontact spotter to avoid interference from dust and
sensitivity to shifts in relative humidity. Another essential feature
is that the instrument is able to be used as a liquid handling robot.
Docket Number: 08039. Applicant: University of MichiganDearborn,
Dearborn, MI 48128. Instrument: XRay Computer Tomography System.
Manufacturer: Phoenix XRay Inc., Germany. Intended Use: See notice at
73 FR 45209, August 4, 2008. Reasons: The instrument has an Xray tube
power high enough to penetrate metal alloy specimens which is required
for the research. It also has a relatively high resolution which is also essential to the research.
Dated: August 13, 2008.
Faye Robinson,
Director, Statutory Import Programs Staff, Import Administration. [FR Doc. E819172 Filed 81808; 8:45 am]
BILLING CODE 3510DSS
14 CFR Part 39 40 CFR Part 52 14 CFR Part 71 33 CFR Part 165 50 CFR Part 679 47 CFR Part 73 26 CFR Part 1 40 CFR Part 180 33 CFR Part 117 50 CFR Part 17 44 CFR Part 67 50 CFR Part 648 14 CFR Part 97 33 CFR Part 100 40 CFR Part 63 50 CFR Part 622 44 CFR Part 65 50 CFR Part 660 26 CFR Part 301 39 CFR Part 111 40 CFR Part 300 6 CFR Part 5 40 CFR Part 271 47 CFR Part 64 40 CFR Parts 52 and 81 50 CFR Part 665 44 CFR Part 64 10 CFR Part 50 49 CFR Part 571 47 CFR Part 76